Analytik Jena B-100YP 晶圆表面检查灯

Analytik Jena  B-100YP 95-0127-04表面检查灯

Analytik Jena B-100YP表面检查灯可快速检查加工表面的瑕疵，灰尘，异物等小至10微米的瑕疵、小颗粒，高强度抗冲击外壳由有Cool-Touch阻热材料制造，可长时间工作不产生高温。黄色滤光片能滤掉波长小于500nm的光线，产生543nm、574和576nm的光线。高对比度的光线可检测表面小于10微米的颗粒。b-100Y铝合金外壳，B-100YP带塑料外壳。表面晶粒检查灯主要用于LCD滤光片、偏光板、晶圆、半导体、玻璃或金属表面刮痕及灰尘检查。

B-100YP 95-0127-04表面检查灯主要特点

• 检查精密加工表面的瑕疵、污点、异物等

• 快速无损检测小至10微米的瑕疵、小颗粒

• 有效地探测出生产过程是早期的污物，节省生产时间及不必要的成本

• 100瓦高强度汞灯发出543,574及576nm波长光谱

• 黄色滤色片滤掉波长小于500nm的光线，防止产生荧光干扰

• 高对比度的光线能清晰检测到精细的表面粒子

• B-100Y是铝合金外壳; B-100YP带塑料外壳

• 灯头人体工学设计，易于操作

Analytik Jena B-100Y和B-100YP

These models feature a yellow filter which blocks wavelengths shorter than 500 nm and produces three strong mercury lines at 543, 574 and 576 nm. The high contrast light is produced for fine surface particle detection. Particles down to 10 microns are routinely visible with this lamp. The B-100Y is built with aluminum housing and the B-100YP with a plastic housing. These lamps are excellent for semiconductor wafer inspection as most photoresist absorption occurs below 450 nm.

Applications include:

Fluorescence Inspections

Non Destructive Testing

Leak Detection

Readmission

Order Information